First-principles study of point-defect production in Si and SiC LAUR975136 DE98 004372

First-principles study of point-defect production in Si and SiC

LAUR975136 DE98 004372

Call No. (NDL): LS-DE98/004372
Bibliographic ID of National Diet Library: 000005918383

Material type: 規格・テクニカルリポート類

Author: Windl, Wほか

Publisher: -

Publication date: 1998

Material Format: Microform

Capacity, size, etc.: 9 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: First-principles study of point-defect production in Si and SiC
Author/Editor: Windl, W
Lenosky, T. J
Kress, J. D
Voter, A. F
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 9 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : LAUR975136
テクニカルリポート番号 : DE98 004372
Holding library: 国立国会図書館
Call No.: LS-DE98/004372
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005918383
http://id.ndl.go.jp/bib/000005918383
Bibliographic Record Category (NDL): 291