Status of radiation damage measurements in room temperature semiconductor radiation detectors SAND988237 DE98 053030

Status of radiation damage measurements in room temperature semiconductor radiation detectors

SAND988237 DE98 053030

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Material Type: 規格・テクニカルリポート類
Title: Status of radiation damage measurements in room temperature semiconductor radiation detectors
Author/Editor: Franks, L. A
James, R. B
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 16 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND988237
テクニカルリポート番号 : DE98 053030
Holding library: 国立国会図書館
Call No.: LS-DE98/053030
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005918738
http://id.ndl.go.jp/bib/000005918738
Bibliographic Record Category (NDL): 291