Stress relaxation testing as a basis for creep analysis and design of silicon nitride ASME-99-GT-291

Stress relaxation testing as a basis for creep analysis and design of silicon nitride

ASME-99-GT-291

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Material Type: 規格・テクニカルリポート類
Title: Stress relaxation testing as a basis for creep analysis and design of silicon nitride
Author/Editor: Woodford, David A
Wereszczak, Andrew A
Bakker, Wate T
Publication Date: 1999
Publication Date (W3CDTF): 1999
Extent: 8 p
Alternative Title: International gas turbine & aeroengine congress & exhibition. Indianapolis, Ind. Jun. 1999
Report No.: テクニカルリポート番号 : ASME-99-GT-291
Holding library: 国立国会図書館
Call No.: M-ASME-99-GT-291
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005940749
http://id.ndl.go.jp/bib/000005940749
Bibliographic Record Category (NDL): 291