Characterizing and modeling the apparent anomalous behavior of resistivity in Cr-Si-O thin films UCRLJC130073 DE98 054784

Characterizing and modeling the apparent anomalous behavior of resistivity in Cr-Si-O thin films

UCRLJC130073 DE98 054784

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 規格・テクニカルリポート類
Title: Characterizing and modeling the apparent anomalous behavior of resistivity in Cr-Si-O thin films
Author/Editor: Jankowski, A. F
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 17 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRLJC130073
テクニカルリポート番号 : DE98 054784
Holding library: 国立国会図書館
Call No.: LS-DE98/054784
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005946247
http://id.ndl.go.jp/bib/000005946247
Bibliographic Record Category (NDL): 291