Radiation damage measurements in room temperature semiconductor radiation detectors SAND982192C DE99 001061

Radiation damage measurements in room temperature semiconductor radiation detectors

SAND982192C DE99 001061

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Material Type: 規格・テクニカルリポート類
Title: Radiation damage measurements in room temperature semiconductor radiation detectors
Author/Editor: Franks, L. A
Olsen, R. W
James, R. B
Brunett, B. A
Walsh, D. S
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 11 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND982192C
テクニカルリポート番号 : DE99 001061
Holding library: 国立国会図書館
Call No.: LS-DE99/001061
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005966674
http://id.ndl.go.jp/bib/000005966674
Bibliographic Record Category (NDL): 291