Shuttle Mission STS-50: Orbital Processing of High-Quality CdTe Compound Semiconductors Experiment: Final Flight Sample Characterization Report NASACR1999209567 N1999-0064432

Shuttle Mission STS-50: Orbital Processing of High-Quality CdTe Compound Semiconductors Experiment: Final Flight Sample Characterization Report

NASACR1999209567 N1999-0064432

Call No. (NDL): LS-N1999/0064432
Bibliographic ID of National Diet Library: 000006084153

Material type: 規格・テクニカルリポート類

Author: Larson, D. Jほか

Publisher: -

Publication date: 1998

Material Format: Microform

Capacity, size, etc.: 178 p. (2 microfiches)

NDC: -

View All

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type: 規格・テクニカルリポート類
Title: Shuttle Mission STS-50: Orbital Processing of High-Quality CdTe Compound Semiconductors Experiment: Final Flight Sample Characterization Report
Author/Editor: Larson, D. J
Casagrande, L. G
DiMarzio, D
Alexander, J. I. D
Carlson, F
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 178 p. (2 microfiches)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASACR1999209567
テクニカルリポート番号 : N1999-0064432
Holding library: 国立国会図書館
Call No.: LS-N1999/0064432
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006084153
http://id.ndl.go.jp/bib/000006084153
Bibliographic Record Category (NDL): 291