X-ray refraction topography for non-destructive evaluation of advanced materials SME-IQ01-154

X-ray refraction topography for non-destructive evaluation of advanced materials

SME-IQ01-154

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Material Type: 規格・テクニカルリポート類
Title: X-ray refraction topography for non-destructive evaluation of advanced materials
Author/Editor: Muller, Bernd R
Lange, Axel
Publication Date: 2001
Publication Date (W3CDTF): 2001
Extent: 7 p
Report No.: テクニカルリポート番号 : SME-IQ01-154
Holding library: 国立国会図書館
Call No.: M-SME-IQ01-154
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006097662
http://id.ndl.go.jp/bib/000006097662
Bibliographic Record Category (NDL): 291