Computed electron micrographs and defect identification. By A. K. Head, P. Humble, L. M. Clarebrough, a.o. (Defects in crystalline solids, v. 7)

Computed electron micrographs and defect identification. By A. K. Head, P. Humble, L. M. Clarebrough, a.o.

(Defects in crystalline solids, v. 7)

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Material Type: 図書
ISBN: 0444104623 (American Elsevier)
Title: Computed electron micrographs and defect identification. By A. K. Head, P. Humble, L. M. Clarebrough, a.o.
Series Title: Defects in crystalline solids, v. 7
Author Heading: Head, A. K.
Publication, Distribution, etc.: Amsterdam : North-Holland Pub. Co.
Publication Date: 1973.
Publication Date (W3CDTF): 1973
Extent: x, 400 p. with illus. 23 cm.
Place of Publication (Country Code): NL
Text Language Code: eng
Subject Heading: Metals -- Defects -- Data processing.
Electron microscopy -- Data processing.
LCC: QD921
DDC: 548/.842/02854
NDLC: ND448
MC145
Note (Bibliography): Bibliography: p. [387]-389.
Holding library: 国立国会図書館
Call No.: ND448-13
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006159601
http://id.ndl.go.jp/bib/000006159601
LC Control Number: 72093092
https://lccn.loc.gov/72093092
Bibliographic Record Category (NDL): 211