Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.].

(I.E.E. conference publication ; no. 174)

Call No. (NDL): ND416-40
Bibliographic ID of National Diet Library: 000006160101

Material type: 図書

Author: Institution of Electrical Engineers.ほか

Publisher: Institution of Electrical Engineers

Publication date: c1979.

Material Format: Paper

Capacity, size, etc.: vii, 157 p. : ill. ; 30 cm.

NDC: -

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Notes on use

Note (General)：: Cover and spine title: Electronic test and measuring instrumentation--Testmex 79.

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Paper

Material Type: 図書
ISBN: 0852962045
Title: Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.].
Series Title: I.E.E. conference publication ; no. 174
Title Heading: Institution of Electrical Engineers. I.E.E. conference publication ; no. 174.
Author Heading: Institution of Electrical Engineers.
Conference on Electronic Test and Measuring Instrumentation--Testmex, Wembley, Eng., 1979.
Publication, Distribution, etc.: London : Institution of Electrical Engineers
New York : Institution of Electrical Engineers
Publication Date: c1979.
Publication Date (W3CDTF): 1979
Extent: vii, 157 p. : ill. ; 30 cm.
Alternative Title: Electronic test and measuring instrumentation--Testmex 79.
Place of Publication (Country Code): GB
Text Language Code: eng
Subject Heading: Electronic instruments -- Congresses.
Electronic measuring instruments & electronic testing equipment.
LCC: TK7878.4
DDC: 621.3815/48
NDLC: ND416
Note (General): Cover and spine title: Electronic test and measuring instrumentation--Testmex 79.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: ND416-40
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006160101
http://id.ndl.go.jp/bib/000006160101
LC Control Number: 79322451
https://lccn.loc.gov/79322451
Bibliographic Record Category (NDL): 211