European Conference on Optics Applied to Metrology. (Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 136)

European Conference on Optics Applied to Metrology.

(Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 136)

Notes on use

Note (General)：: Organized by the European Photonics Association, Comité international d'optique, and the Society.Editors: Michel Grosmann and Patrick Meyrueis.

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Material Type: 図書
Title: European Conference on Optics Applied to Metrology.
Series Title: Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 136
Author Heading: Grosmann, Michel.
Meyrueis, Patrick ( 00990345 )Authorities
European Photonics Association.
International Commission for Optics.
Society of Photo-optical Instrumentation Engineers.
European Conference on Optics Applied to Metrology.
Publication, Distribution, etc.: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers
Publication Date: c1978.
Publication Date (W3CDTF): 1977
Extent: 1 v. : ill. ; 28 cm.
Alternative Title: Optics applied to metrology
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optical measurements -- Congresses.
Speckle metrology -- Congresses.
NDLC: ME115
Note (General): Organized by the European Photonics Association, Comité international d'optique, and the Society.
Editors: Michel Grosmann and Patrick Meyrueis.
Holding library: 国立国会図書館
Call No.: ME115-36
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006181244
http://id.ndl.go.jp/bib/000006181244
Bibliographic Record Category (NDL): 211