Psychometrics for educational debates / edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter.

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Note (General)：: "Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."

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Material Type: 図書
ISBN: 0471275964
Title: Psychometrics for educational debates / edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter.
Author Heading: International Symposium on Educational Testing, 3d, Leyden, 1977.
Kamp, Leo J. Th. van der.
Langerak, Willem F.
Gruijter, Dato N. de.
Publication, Distribution, etc.: Chichester : Wiley
New York : Wiley
Publication Date: c1980.
Publication Date (W3CDTF): 1980
Extent: x, 337 p. : ill. ; 24 cm.
Place of Publication (Country Code): GB
Text Language Code: eng
Subject Heading: Educational tests and measurements -- Congresses.
LCC: LB3051
DDC: 371.2/6
NDLC: FC63
Note (General): "Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."
Note (Bibliography): Includes bibliographies and indexes.
Holding library: 国立国会図書館
Call No.: FC63-69
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006228705
http://id.ndl.go.jp/bib/000006228705
LC Control Number: 79004308
https://lccn.loc.gov/79004308
Bibliographic Record Category (NDL): 211