Testing to integrate semiconductor memories into computer mainframes; digest of papers. Sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute of Electrical and Electronics Engineers, Inc.

• Material Type: 図書
• Title: Testing to integrate semiconductor memories into computer mainframes; digest of papers. Sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute of Electrical and Electronics Engineers, Inc.
• Author Heading: Institute of Electrical and Electronics Engineers. Philadelphia Chapter.; IEEE Computer Society. Mideast Area Committee.; Semiconductor Memory Test Symposium (1972 : Cherry Hill, N. J.)
• Publication, Distribution, etc.: New York : Institute of Electrical and Electronics Engineers
• Publication Date: 1973.
• Publication Date (W3CDTF): 1973
• Extent: 96 p. diagrs., graph, tables, 18 cm.
• Alternative Title: IEEE 1972 Semiconductor memories computer mainframes.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Electronic digital computers -- Memory systems.
• NDLC: M164
• Note (General): Cover title: IEEE 1972 Semiconductor memories computer mainframes.
• Holding library: 国立国会図書館
• Call No.: M164-2
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006327154; http://id.ndl.go.jp/bib/000006327154
• Bibliographic Record Category (NDL): 211