Semiconductor measurement technology. Rev. Mar. 1982. (NBS list of publications ; 72)

Semiconductor measurement technology.

Rev. Mar. 1982.

Notes on use

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
Title: Semiconductor measurement technology.
Edition: Rev. Mar. 1982.
Series Title: NBS list of publications ; 72
Author Heading: United States. National Bureau of Standards.
Publication, Distribution, etc.: Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards
Publication Date: 1982.
Publication Date (W3CDTF): 1982
Extent: 55 p. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Measurement.
Semiconductors -- Testing.
LCC: TK7871.85
DDC: 016.6213815/2/0287
NDLC: ND1
ND371
Note (General): Cover title.
Item 240-A-1.
Holding library: 国立国会図書館
Call No.: ND1-30
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006361843
http://id.ndl.go.jp/bib/000006361843
LC Control Number: 82601772
https://lccn.loc.gov/82601772
Bibliographic Record Category (NDL): 211