Digest of papers ... Semiconductor Test Conference.

• Material Type: 図書
• Title: Digest of papers ... Semiconductor Test Conference.
• Author Heading: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.; Semiconductor Test Conference.
• Publication, Distribution, etc.: New York : Institute of Electrical and Electronics Engineers
• Publication Date: 1978.
• Publication Date (W3CDTF): 1978
• Extent: 1 v. : ill. ; 28 cm.
• Alternative Title: LSI & boards; IEEE ... Semiconductor Test Conference
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Semiconductor storage devices -- Congresses.
• NDLC: ND386
• Note (Bibliography): Bibliographical references included.
• Holding library: 国立国会図書館
• Call No.: ND386-21
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006400089; http://id.ndl.go.jp/bib/000006400089
• Bibliographic Record Category (NDL): 211