Preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein (NBS special publication ; 260-93)

Preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein

(NBS special publication ; 260-93)

Notes on use

Note (General)：: Distributed to depository libraries in microfiche"Issued January 1985."Physical description for original version: ix, 30 p. : 28 cm

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Material Type: 図書
Title: Preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein
Series Title: NBS special publication ; 260-93
Author Heading: Ehrstein, James R
United States. National Bureau of Standards
Publication Date (W3CDTF): 1985
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Electric resistance -- Measurement
Silicon -- Electric properties
Note (General): Distributed to depository libraries in microfiche
"Issued January 1985."
Physical description for original version: ix, 30 p. : 28 cm
Note (Bibliography): Bibliography: p. 21
Note (Original Version): 原資料の出版事項: [Gaithersburg, MD] ; Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1985
SUPTDOC番号: C 13.10: 260-93
テクニカルリポート番号: NBS/SP-260/93
GPO管理番号: 247 (microfiche)
Holding library: 国立国会図書館
Call No.: YCA-C 13.10:260-93
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006526840
http://id.ndl.go.jp/bib/000006526840
GPO No.: 85022648
Bibliographic Record Category (NDL): 281