Beyond standardized testing microform : assessing authentic academic achievement in the secondary school / Doug A. Archbald, Fred M.Newmann

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Note (General)：: Distributed to depository libraries in microfichePhysical description for original version: 1 v

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Material Type: 図書
Title: Beyond standardized testing microform : assessing authentic academic achievement in the secondary school / Doug A. Archbald, Fred M.Newmann
Author Heading: Archbald, Doug A
Newmann, Fred M
Educational Resources Information Center (U.S.)
Extent: microfiche
Size: 11 × 15 cm
Alternative Title: Assessing authentic academic achievement in the secondary school
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Academic achievement -- United States -- Evaluation
Note (General): Distributed to depository libraries in microfiche
Physical description for original version: 1 v
Note (Original Version): 原資料の出版事項: Reston, Va. ; [Washington, DC] : National Association of Secondary School Principals : U.S. Dept. of Education, Office of Educational Research and Improvement, Educational Resources Information Center, [1988]
SUPTDOC番号: ED 1.310/2: 301587
GPO管理番号: 0466-A-03 (MF)
Holding library: 国立国会図書館
Call No.: YCA-ED 1.310/2:301587
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006572544
http://id.ndl.go.jp/bib/000006572544
OCLC No.: 26474397
https://www.worldcat.org/oclc/26474397
Bibliographic Record Category (NDL): 281