図書

Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon / G.A. Candela ... [et al.] (Standard reference materials) (NIST special publication ; 260-109)

Icons representing 図書

Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon / G.A. Candela ... [et al.]

(Standard reference materials) (NIST special publication ; 260-109)

Call No. (NDL)
YCA-C 13.10:260-109
Bibliographic ID of National Diet Library
000006578573
Material type
図書
Author
Candela, G. A. (George A.)ほか
Publisher
-
Publication date
1988
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
View All

Notes on use

Note (General):

Distributed to depository libraries in microficheNo longer available for sale by the Supt. of Docs"Issued October 1988."...

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type
図書
Publication Date (W3CDTF)
1988
Extent
microfiche
Size
11 × 15 cm
Place of Publication (Country Code)
US
Text Language Code
eng
Note (Material Type)
[microform]