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図書

Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon / G.A. Candela ... [et al.] (Standard reference materials) (NIST special publication ; 260-109)

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Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon / G.A. Candela ... [et al.]

(Standard reference materials) (NIST special publication ; 260-109)

Call No. (NDL)
YCA-C 13.10:260-109
Bibliographic ID of National Diet Library
000006578573
Material type
図書
Author
Candela, G. A. (George A.)ほか
Publisher
-
Publication date
1988
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Notes on use

Note (General):

Distributed to depository libraries in microficheNo longer available for sale by the Supt. of Docs"Issued October 1988."...

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Microform

Material Type
図書
Publication Date (W3CDTF)
1988
Extent
microfiche
Size
11 × 15 cm
Place of Publication (Country Code)
US
Text Language Code
eng
Note (Material Type)
[microform]