図書

A programmable reverse-bias safe operating area transistor tester [microform] / D.W. Berning (NIST special publication ; 400-87) (Semiconductor measurement technology)

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A programmable reverse-bias safe operating area transistor tester [microform] / D.W. Berning

(NIST special publication ; 400-87) (Semiconductor measurement technology)

Call No. (NDL)
YCA-C 13.10:400-87
Bibliographic ID of National Diet Library
000006585982
Material type
図書
Author
Berning, David Wほか
Publisher
-
Publication date
1990
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Distributed to depository libraries in microficheShipping list no.: 92-1526-MPaper version no longer for sale by the Supt. of Docs...

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Microform

Material Type
図書
Publication Date (W3CDTF)
1990
Extent
microfiche
Size
11 × 15 cm
Alternative Title
Programmable reverse bias safe operating area transistor tester
Place of Publication (Country Code)
US
Text Language Code
eng