Thermal resistance measurements [microform] / Frank F. Oettinger and David L. Blackburn (NIST special publication ; 400-86) (Semiconductor measurement technology)

Thermal resistance measurements [microform] / Frank F. Oettinger and David L. Blackburn

(NIST special publication ; 400-86) (Semiconductor measurement technology)

Call No. (NDL): YCA-C 13.10:400-86
Bibliographic ID of National Diet Library: 000006585985

Material type: 図書

Author: Oettinger, Frank Fほか

Publisher: -

Publication date: 1990

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Note (General)：: Distributed to depository libraries in microficheShipping list no.: 92-1876-MPaper version no longer for sale by the Supt. of Docs...

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Material Type: 図書
Title: Thermal resistance measurements [microform] / Frank F. Oettinger and David L. Blackburn
Series Title: NIST special publication ; 400-86
Semiconductor measurement technology
Author Heading: Oettinger, Frank F
Blackburn, David L
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1990
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Power transistors -- Thermal properties
Integrated circuits -- Testing
Temperature measurements
Note (General): Distributed to depository libraries in microfiche
Shipping list no.: 92-1876-M
Paper version no longer for sale by the Supt. of Docs
"July 1990."
Physical description for original version: v, 72 p. : 28 cm
Note (Bibliography): Includes bibliographical references (p. 68-72)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD ; [Springfield, VA : U.S. Dept. of Commerce, National Institute of Standards and Technology : Order from National Technical Information Service], 1990
SUPTDOC番号: C 13.10: 400-86
GPO管理番号: 0247 (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.10:400-86
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006585985
http://id.ndl.go.jp/bib/000006585985
OCLC No.: 26978907
https://www.worldcat.org/oclc/26978907
Bibliographic Record Category (NDL): 281