図書

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick (Standard reference materials) (NIST special publication ; 260-117)

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Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick

(Standard reference materials) (NIST special publication ; 260-117)

Call No. (NDL)
YCA-C 13.10:260-117
Bibliographic ID of National Diet Library
000006586088
Material type
図書
Author
Vezzetti, Carol Fほか
Publisher
-
Publication date
1992
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Distributed to depository libraries in microficheShipping list no.: 92-2096-MPaper version no longer for sale by the Supt. of Docs...

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Microform

Material Type
図書
Publication Date (W3CDTF)
1992
Extent
microfiche
Size
11 × 15 cm
Alternative Title
Antireflecting chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Place of Publication (Country Code)
US
Text Language Code
eng