Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites [microform] / David G. Seiler ... [et al.]

• Material Type: 図書
• Title: Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites [microform] / David G. Seiler ... [et al.]
• Series Title: Semiconductor measurement technology; NIST special publication ; 400-94
• Author Heading: Seiler, David G; National Institute of Standards and Technology (U.S.)
• Publication Date (W3CDTF): 1994
• Extent: microfiche
• Size: 11 × 15 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Note (Material Type): [microform]
• Subject Heading: Infrared detectors -- United States; Meteorological satellites -- United States; Geostationary satellites; Tiros (Meteorological satellite)
• Note (General): Distributed to depository libraries in microfiche; Shipping list no.: 94-0562-M; "April 1994."; Physical description for original version: 1 v. (various pagings)
• Note (Bibliography): Includes bibliographical references
• Note (Original Version): 原資料の出版事項: Gaithersburg, MD ; Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., 1994; SUPTDOC番号: C 13.10: 400-94; GPO管理番号: 0247 (MF)
• Holding library: 国立国会図書館
• Call No.: YCA-C 13.10:400-94
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006594393; http://id.ndl.go.jp/bib/000006594393
• OCLC No.: 31351017; https://www.worldcat.org/oclc/31351017
• Bibliographic Record Category (NDL): 281