図書

User's manual for the program MONSEL-1 [microform] : Monte Carlo simulation of SEM signals for linewidth metrology / Jeremiah R. Lowney and Egon Marx (Semiconductor measurement technology) (NIST special publication ; 400-95)

Icons representing 図書

User's manual for the program MONSEL-1 [microform] : Monte Carlo simulation of SEM signals for linewidth metrology / Jeremiah R. Lowney and Egon Marx

(Semiconductor measurement technology) (NIST special publication ; 400-95)

Call No. (NDL)
YCA-C 13.10:400-95
Bibliographic ID of National Diet Library
000006596075
Material type
図書
Author
Lowney, J. R. (Jeremiah Ralph) , 1946-ほか
Publisher
-
Publication date
1994
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
View All

Notes on use

Note (General):

Distributed to depository libraries in microficheShipping list no.: 94-0956-M"August 1994."...

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type
図書
Publication Date (W3CDTF)
1994
Extent
microfiche
Size
11 × 15 cm
Place of Publication (Country Code)
US
Text Language Code
eng
Note (Material Type)
[microform]