図書

Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry [microform] / Brian G. Rennex (NIST special publication ; 260-121) (Standard reference materials)

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Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry [microform] / Brian G. Rennex

(NIST special publication ; 260-121) (Standard reference materials)

Call No. (NDL)
YCA-C 13.10:260-121
Bibliographic ID of National Diet Library
000006596086
Material type
図書
Author
Rennex, Brianほか
Publisher
-
Publication date
1994
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Notes on use

Note (General):

Distributed to depository libraries in microficheShipping list no.: 94-0735-M"Issued August 1994."...

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Microform

Material Type
図書
Publication Date (W3CDTF)
1994
Extent
microfiche
Size
11 × 15 cm
Place of Publication (Country Code)
US
Text Language Code
eng
Note (Material Type)
[microform]