図書

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system [microform] / Victor A. Carreno, G. Choi and R.K. Iyer (NASA technical memorandum ; 4241)

Icons representing 図書

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system [microform] / Victor A. Carreno, G. Choi and R.K. Iyer

(NASA technical memorandum ; 4241)

Call No. (NDL)
YCA-NAS 1.15:4241
Bibliographic ID of National Diet Library
000006597656
Material type
図書
Author
Carreno, Victor Aほか
Publisher
-
Publication date
1990
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
View All

Notes on use

Note (General):

Distributed to depository libraries in microfichePhysical description for original version: 1 v

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type
図書
Publication Date (W3CDTF)
1990
Extent
microfiche
Size
11 × 15 cm
Alternative Title
Analog digital simulation of transient induced logic errors and upset susceptibility of an advanced control system
Place of Publication (Country Code)
US
Text Language Code
eng