Test load verification through strain data analysis [microform] / V. Verderaime and F. Harrington (NASA technical paper ; 3558)

Test load verification through strain data analysis [microform] / V. Verderaime and F. Harrington

(NASA technical paper ; 3558)

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Note (General)：: Distributed to depository libraries in microficheShipping list no.: 95-0744-MPhysical description for original version: 1 v

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Material Type: 図書
Title: Test load verification through strain data analysis [microform] / V. Verderaime and F. Harrington
Series Title: NASA technical paper ; 3558
Author Heading: Verderaime, V
Harrington, F
George C. Marshall Space Flight Center
Publication Date (W3CDTF): 1995
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Compression loads
Criteria
Elastic bending
Fracturing
Inelastic stress
Polycrystals
Proving
Safety factors
Static tests
Note (General): Distributed to depository libraries in microfiche
Shipping list no.: 95-0744-M
Physical description for original version: 1 v
Note (Original Version): 原資料の出版事項: MSFC, Ala. ; [Springfield, Va. : National Aeronautics and Space Administration, Marshall Space Flight Center : National Technical Information Service, distributor, 1995]
SUPTDOC番号: NAS 1.60: 3558
GPO管理番号: 0830-H-15 (MF)
Holding library: 国立国会図書館
Call No.: YCA-NAS 1.60:3558
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006599823
http://id.ndl.go.jp/bib/000006599823
OCLC No.: 33413940
https://www.worldcat.org/oclc/33413940
Bibliographic Record Category (NDL): 281