NIST measurement assurance program for capacitance standards at 1 kHz [microform] / Y. May Chang (NIST technical note ; 1417)

NIST measurement assurance program for capacitance standards at 1 kHz [microform] / Y. May Chang

(NIST technical note ; 1417)

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Note (General)：: Distributed to depository libraries in microficheShipping list no.: 98-0003-MPaper version no longer available for sale by the Supt. of Docs...

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Material Type: 図書
Title: NIST measurement assurance program for capacitance standards at 1 kHz [microform] / Y. May Chang
Series Title: NIST technical note ; 1417
Author Heading: Chang, Y. May
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1996
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Capacitance meters -- Calibration
Electric capacity -- Standards -- United States
Note (General): Distributed to depository libraries in microfiche
Shipping list no.: 98-0003-M
Paper version no longer available for sale by the Supt. of Docs
"March 1996."
Physical description for original version: iv, 19 p. : 28 cm
Note (Bibliography): Includes bibliographical references (p. 10)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996
SUPTDOC番号: C 13.46: 1417
GPO管理番号: 0249-A (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.46:1417
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006608955
http://id.ndl.go.jp/bib/000006608955
OCLC No.: 37996564
https://www.worldcat.org/oclc/37996564
Bibliographic Record Category (NDL): 281