図書

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems [microform] / James E. Potzick (NIST special publication ; 260-129) (Standard reference materials)

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Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems [microform] / James E. Potzick

(NIST special publication ; 260-129) (Standard reference materials)

Call No. (NDL)
YCA-C 13.10:260-129
Bibliographic ID of National Diet Library
000006610380
Material type
図書
Author
Potzick, James Eほか
Publisher
-
Publication date
1997
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Notes on use

Note (General):

Distributed to depository libraries in microficheShipping list no.: 98-0086-MPhysical description for original version: xiii, 23 p. : 28 cm

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Microform

Material Type
図書
Publication Date (W3CDTF)
1997
Extent
microfiche
Size
11 × 15 cm
Alternative Title
Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Place of Publication (Country Code)
US
Text Language Code
eng