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図書

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin (NIST special publication ; 260-131) (Standard reference materials)

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The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin

(NIST special publication ; 260-131) (Standard reference materials)

Call No. (NDL)
YCA-C 13.10:260-131
Bibliographic ID of National Diet Library
000006613106
Material type
図書
Author
Ehrstein, James Rほか
Publisher
-
Publication date
1997
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Notes on use

Note (General):

Shipping list no.: 98-0569-M"August 1997."Physical description for original version: xv, 84 p. : 28 cm

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Microform

Material Type
図書
Publication Date (W3CDTF)
1997
Extent
microfiche
Size
11 × 15 cm
Alternative Title
Certification of one hundred mm diameter silicon resistivity SRMs ..
Place of Publication (Country Code)
US
Text Language Code
eng