Noise temperature measurements on wafer [microform] / J. Randa (NIST technical note ; 1390)

Noise temperature measurements on wafer [microform] / J. Randa

(NIST technical note ; 1390)

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Note (General)：: Shipping list no.: 98-0579-MPaper version no longer available for sale by the Supt. of Docs"March 1997."...

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Material Type: 図書
Title: Noise temperature measurements on wafer [microform] / J. Randa
Series Title: NIST technical note ; 1390
Author Heading: Randa, J
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1997
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Electronic noise -- Measurement
Note (General): Shipping list no.: 98-0579-M
Paper version no longer available for sale by the Supt. of Docs
"March 1997."
Physical description for original version: iii, 57 p.
Note (Bibliography): Includes bibliographical references (p. 33-36)
Note (Original Version): 原資料の出版事項: Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997
SUPTDOC番号: C 13.46: 1390
GPO管理番号: 0249-A (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.46:1390
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006614164
http://id.ndl.go.jp/bib/000006614164
OCLC No.: 39472843
https://www.worldcat.org/oclc/39472843
Bibliographic Record Category (NDL): 281