A back face strain compliance expression for the compact tension specimen [microform] / William T. Riddell and Robert S. Piascik (NASA/TM ; 1998-208453)

A back face strain compliance expression for the compact tension specimen [microform] / William T. Riddell and Robert S. Piascik

(NASA/TM ; 1998-208453)

Call No. (NDL): YCA-NAS 1.15:208453
Bibliographic ID of National Diet Library: 000006624157

Material type: 図書

Author: Riddell, William Tほか

Publisher: -

Publication date: 1998

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Note (General)：: Shipping list no.: 99-0559-MPhysical description for original version: 1 v

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Microform

Material Type: 図書
Title: A back face strain compliance expression for the compact tension specimen [microform] / William T. Riddell and Robert S. Piascik
Series Title: NASA/TM ; 1998-208453
Title Heading: NASA technical memorandum ; 208453
Author Heading: Riddell, William T
Piascik, Robert S
Langley Research Center
Publication Date (W3CDTF): 1998
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Stress intensity factors
Crack propagation
Tensile stress
Stress distribution
Fracture mechanics
Cracking (Fracturing)
Note (General): Shipping list no.: 99-0559-M
Physical description for original version: 1 v
Note (Original Version): 原資料の出版事項: Hampton, Va. ; [Springfield, Va. : National Aeronautics and Space Administration, Langley Research Center : National Technical Information Service, distributor, 1998]
SUPTDOC番号: NAS 1.15: 208453
GPO管理番号: 0830-D (MF)
Holding library: 国立国会図書館
Call No.: YCA-NAS 1.15:208453
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006624157
http://id.ndl.go.jp/bib/000006624157
OCLC No.: 41553932
https://www.worldcat.org/oclc/41553932
Bibliographic Record Category (NDL): 281