The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin 1999 ed (NIST special publication ; 260-131) (Standard reference materials)

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin

1999 ed

(NIST special publication ; 260-131) (Standard reference materials)

Call No. (NDL): YCA-C 13.48/4:260-131
Bibliographic ID of National Diet Library: 000006625739

Material type: 図書

Author: Ehrstein, James Rほか

Publisher: -

Publication date: 1999

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Notes on use

Note (General)：: "Supercedes NIST special publication 260-131, August 1997."Shipping list no.: 99-0777-M"Issued June 1999."...

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Microform

Material Type: 図書
Title: The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin
Edition: 1999 ed
Series Title: NIST special publication ; 260-131
Standard reference materials
Author Heading: Ehrstein, James R
Croarkin, M. C. (Mary Carroll) , 1934-
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1999
Extent: microfiche
Size: 11 × 15 cm
Alternative Title: Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Silicon
Silicon -- Electric properties
Note (General): "Supercedes NIST special publication 260-131, August 1997."
Shipping list no.: 99-0777-M
"Issued June 1999."
Physical description for original version: vi, 106 p.
Note (Bibliography): Includes bibliographical references (p. 44-45)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD ; Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., 1999
SUPTDOC番号: C 13.48/4: 260-131
GPO管理番号: 0248-B (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.48/4:260-131
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006625739
http://id.ndl.go.jp/bib/000006625739
OCLC No.: 42011509
https://www.worldcat.org/oclc/42011509
Bibliographic Record Category (NDL): 281