Fast probing considerations for on-machine inspection of parts [microform] / Alice V. Ling, Neil D. Wilkin (NISTIR ; 6415)

Fast probing considerations for on-machine inspection of parts [microform] / Alice V. Ling, Neil D. Wilkin

(NISTIR ; 6415)

Notes on use

Note (General)：: Shipping list no.: 2000-0127-M"October 1999."Physical description for original version: 22 p.

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Material Type: 図書
Title: Fast probing considerations for on-machine inspection of parts [microform] / Alice V. Ling, Neil D. Wilkin
Series Title: NISTIR ; 6415
Author Heading: Ling, Alice V
Wilkin, Neil D
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1999
Extent: microfiche
Size: 11 × 15 cm
Alternative Title: Fast probing considerations for on machine inspection of parts
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Probes (Electronic instruments) -- Calibration
Machining -- Computer programs
Machine parts -- Inspection
Note (General): Shipping list no.: 2000-0127-M
"October 1999."
Physical description for original version: 22 p.
Note (Bibliography): Includes bibliographical references (p. 12)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
SUPTDOC番号: C 13.58: 6415
GPO管理番号: 0247-D (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.58:6415
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006631348
http://id.ndl.go.jp/bib/000006631348
OCLC No.: 43477967
https://www.worldcat.org/oclc/43477967
Bibliographic Record Category (NDL): 281