The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber [microform] / Jay J. Ely, Truong X. Nguyen, Stephen A. Searce

• Material Type: 図書
• Title: The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber [microform] / Jay J. Ely, Truong X. Nguyen, Stephen A. Searce
• Series Title: NASA/TM ; 2000-209844
• Title Heading: NASA technical memorandum ; 209844
• Author Heading: Ely, Jay J; Nguyen, Truong X; Scearce, Stephen A; Langley Research Center
• Publication Date (W3CDTF): 2000
• Extent: microfiche
• Size: 11 × 15 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Note (Material Type): [microform]
• Subject Heading: Field tests; Service life; Field strength; Electromagnetic compatibility
• Note (General): Shipping list no.: 2000-0596-M; Physical description for original version: 1 v
• Note (Original Version): 原資料の出版事項: Hampton, Va. ; Hanover, MD ; Springfield, VA : National Aeronautics and Space Administration, Langley Research Center : Available from NASA Center for AeroSpace Information : National Technical Information Service [distributor, 2000]; SUPTDOC番号: NAS 1.15: 209844; GPO管理番号: 0830-D (MF)
• Holding library: 国立国会図書館
• Call No.: YCA-NAS 1.15:209844
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006632875; http://id.ndl.go.jp/bib/000006632875
• OCLC No.: 44163738; https://www.worldcat.org/oclc/44163738
• Bibliographic Record Category (NDL): 281