Randomness testing of the advanced encryption standard finalist candidates [microform] / Juan Soto, Lawrence Bassham (NISTIR ; 6483)

Randomness testing of the advanced encryption standard finalist candidates [microform] / Juan Soto, Lawrence Bassham

(NISTIR ; 6483)

Notes on use

Note (General)：: Shipping list no.: 2000-0794-M"April 2000."Physical description for original version: 14 p. : 28 cm

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Material Type: 図書
Title: Randomness testing of the advanced encryption standard finalist candidates [microform] / Juan Soto, Lawrence Bassham
Series Title: NISTIR ; 6483
Author Heading: Soto, Juan, 1969-
Bassham, Lawrence E
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 2000
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Data encryption (Computer science)
Note (General): Shipping list no.: 2000-0794-M
"April 2000."
Physical description for original version: 14 p. : 28 cm
Note (Bibliography): Includes bibliographical references (p. 10)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
SUPTDOC番号: C 13.58: 6483
GPO管理番号: 0247-D (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.58:6483
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006633915
http://id.ndl.go.jp/bib/000006633915
OCLC No.: 44677693
https://www.worldcat.org/oclc/44677693
Bibliographic Record Category (NDL): 281