How out-of-level testing affects the psychometric quality of test scores [microform] : out-of-level testing report 2 / John Bielinski ... [et al.]

Call No. (NDL): YCA-ED 1.310/2:449174
Bibliographic ID of National Diet Library: 000006641147

Material type: 図書

Author: Bielinski, Johnほか

Publisher: -

Publication date: 2000

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Notes on use

Note (General)：: Shipping list no.: 2002-0148-MPhysical description for original version: 1 v

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Microform

Material Type: 図書
Title: How out-of-level testing affects the psychometric quality of test scores [microform] : out-of-level testing report 2 / John Bielinski ... [et al.]
Author Heading: Bielinski, John
Educational Resources Information Center (U.S.)
Publication Date (W3CDTF): 2000
Extent: microfiche
Size: 11 × 15 cm
Alternative Title: How out of level testing affects the psychometric quality of test scores
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Students with disabilities -- Rating of
Educational tests and measurements
Note (General): Shipping list no.: 2002-0148-M
Physical description for original version: 1 v
Note (Original Version): 原資料の出版事項: [Minneapolis, MN] ; [Washington, DC] : National Center on Educational Outcomes in collaboration with Council of Chief State School Officers : National Association of State Directors of Special Education : U.S. Dept. of Education, Office of Educational Research and Improvement, Educational Resources Information Center, [2000]
SUPTDOC番号: ED 1.310/2: 449174
GPO管理番号: 0466-A-03 (MF)
Holding library: 国立国会図書館
Call No.: YCA-ED 1.310/2:449174
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006641147
http://id.ndl.go.jp/bib/000006641147
OCLC No.: 49762956
https://www.worldcat.org/oclc/49762956
Bibliographic Record Category (NDL): 281