Distributed testing of a device-level interface specification for a metrology system [microform] / John Horst ... [et al.] (NISTIR ; 6851)

Distributed testing of a device-level interface specification for a metrology system [microform] / John Horst ... [et al.]

(NISTIR ; 6851)

Notes on use

Note (General)：: "January 2002."Shipping list no.: 2002-0384-MPhysical description for original version: 19 p. : 28 cm

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Material Type: 図書
Title: Distributed testing of a device-level interface specification for a metrology system [microform] / John Horst ... [et al.]
Series Title: NISTIR ; 6851
Author Heading: Horst, John Albert
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 2002
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Computer software -- Testing
Coordinate measuring machines
Metrology
Note (General): "January 2002."
Shipping list no.: 2002-0384-M
Physical description for original version: 19 p. : 28 cm
Note (Bibliography): Includes bibliographical references (p. 19)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
SUPTDOC番号: C 13.58: 6851
GPO管理番号: 0247-D (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.58:6851
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006642291
http://id.ndl.go.jp/bib/000006642291
OCLC No.: 50263005
https://www.worldcat.org/oclc/50263005
Bibliographic Record Category (NDL): 281