The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument [microform] / Steven G. VanDyk ... [et al.] ; prepared for the 35th Aerospace Mechanisms Symposium ; cosponsored by the Lockheed Martin Missiles and Space and the Aerospace Mechanisms Symposium Committee, Mountain View, California, May 9-11, 2001 ([NASA technical memorandum] ; NASA/TM-2001-210896)

The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument [microform] / Steven G. VanDyk ... [et al.] ; prepared for the 35th Aerospace Mechanisms Symposium ; cosponsored by the Lockheed Martin Missiles and Space and the Aerospace Mechanisms Symposium Committee, Mountain View, California, May 9-11, 2001

([NASA technical memorandum] ; NASA/TM-2001-210896)

Call No. (NDL): YCA-NAS 1.15:210896
Bibliographic ID of National Diet Library: 000006643646

Material type: 図書

Author: VanDyk, Steven Gほか

Publisher: -

Publication date: 2001

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Notes on use

Note (General)：: Shipping list no.: 2002-0157-MPhysical description for original version: 1 v

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Microform

Material Type: 図書
Title: The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument [microform] / Steven G. VanDyk ... [et al.] ; prepared for the 35th Aerospace Mechanisms Symposium ; cosponsored by the Lockheed Martin Missiles and Space and the Aerospace Mechanisms Symposium Committee, Mountain View, California, May 9-11, 2001
Series Title: [NASA technical memorandum] ; NASA/TM-2001-210896
Title Heading: NASA technical memorandum ; 210896
Author Heading: VanDyk, Steven G
Lockheed Martin Missiles & Space (Firm)
NASA Glenn Research Center
Aerospace Mechanisms Symposium (35th : 2001 : Mountain View, Calif.)
Publication Date (W3CDTF): 2001
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Accelerated life tests
Degradation
Flight tests
Imaging techniques
Qualifications
Life (Durability)
Note (General): Shipping list no.: 2002-0157-M
Physical description for original version: 1 v
Note (Original Version): 原資料の出版事項: [Cleveland, Ohio] ; Hanover, MD : National Aeronautics and Space Administration, Glenn Research Center : Available from NASA Center for Aerospace Information, [2001]
SUPTDOC番号: NAS 1.15: 210896
GPO管理番号: 0830-D (MF)
GPO管理番号: 0830-D (online)
Holding library: 国立国会図書館
Call No.: YCA-NAS 1.15:210896
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006643646
http://id.ndl.go.jp/bib/000006643646
OCLC No.: 50732490
https://www.worldcat.org/oclc/50732490
Bibliographic Record Category (NDL): 281