図書

Embedded digital system reliability and safety analyses [microform] / prepared by L.M. Kaufman, B.W. Johnson (NUREG/GR ; 0020)

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Embedded digital system reliability and safety analyses [microform] / prepared by L.M. Kaufman, B.W. Johnson

(NUREG/GR ; 0020)

Call No. (NDL)
YCA-Y 3.N 88:58/0020
Bibliographic ID of National Diet Library
000006645601
Material type
図書
Author
Kaufman, L. Mほか
Publisher
-
Publication date
2001
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Notes on use

Note (General):

"University of Virginia, Department of Electrical Engineering, Center for Safety-Critical Systems.""Date published: February 2001."Paper version no lo...

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Microform

Material Type
図書
Series Title
Publication Date (W3CDTF)
2001
Extent
microfiche
Size
11 × 15 cm
Place of Publication (Country Code)
US
Text Language Code
eng
Note (Material Type)
[microform]