Optical fabrication, testing, and metrology : 30 September-3 October 2003 : St. Etienne, France. : Sep 2003, St. Etienne, France. (SPIE Proceedings ; 5252)

Optical fabrication, testing, and metrology : 30 September-3 October 2003 : St. Etienne, France. : Sep 2003, St. Etienne, France.

(SPIE Proceedings ; 5252)

Call No. (NDL): M17-04-2156
Bibliographic ID of National Diet Library: 000007334365

Material type: 図書

Author: European Optical Society (EOS)ほか

Publisher: SPIE

Publication date: c2004.

Material Format: Paper

Capacity, size, etc.: xxxi, 518 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 0819451363
ISSN (series): 0277-786X
Title: Optical fabrication, testing, and metrology : 30 September-3 October 2003 : St. Etienne, France. : Sep 2003, St. Etienne, France.
Series Title: SPIE Proceedings ; 5252
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 5252
Author Heading: European Optical Society (EOS)
Geyl, Roland.
Rimmer, David.
Wang, Lingli.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2004.
Publication Date (W3CDTF): 2004
Extent: xxxi, 518 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optical instruments -- Design and construction -- Congresses.
Optical instruments -- Testing -- Congresses.
Optical materials -- Congresses.
Metrology -- Congresses.
LCC: TS510
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-04-2156
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007334365
http://id.ndl.go.jp/bib/000007334365
RLIN No.: CTYA6574261-S
Bibliographic Record Category (NDL): 215