Physics and technology of high-k gate dielectrics 2 : proceedings of the second international symposium on high dielectric constant materials: materials science, processing, reliability, and manufacturing issues : held in Orlando, Florida, October 12-16, 2003. : Oct 2003, Orlando, FL. (PV ; 2003-22)

Physics and technology of high-k gate dielectrics 2 : proceedings of the second international symposium on high dielectric constant materials: materials science, processing, reliability, and manufacturing issues : held in Orlando, Florida, October 12-16, 2003. : Oct 2003, Orlando, FL.

(PV ; 2003-22)

Call No. (NDL): M17-04-2359
Bibliographic ID of National Diet Library: 000007377733

Material type: 図書

Author: Kar, S.ほか

Publisher: Electrochemical Society

Publication date: c2004.

Material Format: Paper

Capacity, size, etc.: xvii, 490 p. : ill. ; 24 cm.

NDC: -

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Notes on use

Note (General)：: Selected papers."This symposium (...) was held during its 204th Meeting." -- p. v.

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Paper

Material Type: 図書
ISBN: 1566774055
Title: Physics and technology of high-k gate dielectrics 2 : proceedings of the second international symposium on high dielectric constant materials: materials science, processing, reliability, and manufacturing issues : held in Orlando, Florida, October 12-16, 2003. : Oct 2003, Orlando, FL.
Series Title: PV ; 2003-22
Title Heading: Proceedings (Electrochemical Society) v. 2003-22.
Author Heading: Kar, S.
Electrochemical Society. Meeting (204th : 2003 : Orlando, Florida)
International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues (2nd 2003 : Orlando, Florida)
Publication, Distribution, etc.: Pennington : Electrochemical Society
Publication Date: c2004.
Publication Date (W3CDTF): 2004
Extent: xvii, 490 p. : ill. ; 24 cm.
Alternative Title: Physics and technology of high-k gate dielectrics 2 : proceedings of the 2nd international symposium on high dielectric constant materials: materials science, processing, reliability, and manufacturing issues : held in Orlando, Florida, October 12-16, 2003
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Gate array circuits -- Congresses.
Dielectrics -- Congresses.
NDLC: M17
Note (General): Selected papers.
"This symposium (...) was held during its 204th Meeting." -- p. v.
Note (Bibliography): Includes bibliographic references and indexes.
Holding library: 国立国会図書館
Call No.: M17-04-2359
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007377733
http://id.ndl.go.jp/bib/000007377733
LC Control Number: 2004100366
https://lccn.loc.gov/2004100366
RLIN No.: MOHG54896660-B
Bibliographic Record Category (NDL): 215