2003 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 20-23, 2003. : IRW 2003 : Oct 2003, ------.

Author: International Integrated Reliability Workshop (2003 : Lake Tahoe, California)

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Note (General)：: Papers and abstracts.Held at Lake Tahoe, California, USA.IEEE cat no 03TH8715.

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Material Type: 図書
ISBN: 0780381572
ISBN (error code): 0780381752
Title: 2003 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 20-23, 2003. : IRW 2003 : Oct 2003, ------.
Author Heading: International Integrated Reliability Workshop (2003 : Lake Tahoe, California)
Extent: viii, 182 p. : ill. ; 28 cm.
Text Language Code: eng
Subject Heading: Integrated circuits -- Reliability. -- Congresses.
Integrated circuits -- Wafer-scale integration -- Reliability. -- Congresses.
NDLC: M17
Note (General): Papers and abstracts.
Held at Lake Tahoe, California, USA.
IEEE cat no 03TH8715.
Note (Bibliography): Includes bibliographic references.
Holding library: 国立国会図書館
Call No.: M17-04-2992
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007410970
http://id.ndl.go.jp/bib/000007410970
LC Control Number: 2003110309
https://lccn.loc.gov/2003110309
RLIN No.: MOHG54522893-B
Bibliographic Record Category (NDL): 215