High resolution structure image of silicon and its analysis by dynamical theory of electron diffraction

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Material Type: 博士論文
Title: High resolution structure image of silicon and its analysis by dynamical theory of electron diffraction
Author/Editor: 西田雄彦 [著]
Author Heading: 西田, 雄彦ニシダ, タカヒコ
Extent: 冊
Alternative Title: シリコン結晶の高分解構造像および電子回折の動力学理論による分析シリコンケッショウノコウブンカイコウゾウゾウオヨビデンシカイセツノドウリキガクリロンニヨルブンセキ
Degree grantor/type: 東京理科大学
Date Granted: 昭和56年1月30日
Date Granted (W3CDTF): 1981
Dissertation Number: 乙第122号
Degree Type: 理学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-56-F182
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007582794
http://id.ndl.go.jp/bib/000007582794
Bibliographic Record Category (NDL): 213