Evaluation method of electromigration damage in IC metal lines and its application to practical problems

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Material Type: 博士論文
Title: Evaluation method of electromigration damage in IC metal lines and its application to practical problems
Author/Editor: 長谷川昌孝 [著]
Author Heading: 長谷川, 昌孝ハセガワ, マサタカ
Publication, Distribution, etc.: [長谷川昌孝]
Publication Date: [2004]
Publication Date (W3CDTF): 2004
Extent: 1冊
Alternative Title: 集積回路配線におけるエレクトロマイグレーション損傷の評価法と実用問題へのその応用シュウセキカイロハイセンニオケルエレクトロマイグレーションソンショウノヒョウカホウトジツヨウモンダイエノソノオウヨウ
Degree grantor/type: 東北大学
Date Granted: 平成16年3月25日
Date Granted (W3CDTF): 2004
Dissertation Number: 甲第9625号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2004-P589
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007613502
http://id.ndl.go.jp/bib/000007613502
Bibliographic Record Category (NDL): 213