Accurate characterization of the high pressure environment by in situ X-ray diffraction study and its application to geophysical problems

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Material Type: 博士論文
Title: Accurate characterization of the high pressure environment by in situ X-ray diffraction study and its application to geophysical problems
Author/Editor: 八木健彦 [著]
Author Heading: 八木, 健彦ヤギ, タケヒコ
Extent: 冊
Alternative Title: X線その場観察法による高圧環境の精密化と地球物理学への応用 Xセンソノバカンサツホウニヨルコウアツカンキョウノセイミツカトチキュウブツリガクエノオウヨウ
Degree grantor/type: 東京大学
Date Granted: 昭和51年3月29日
Date Granted (W3CDTF): 1976
Dissertation Number: 甲第3861号
Degree Type: 理学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-52-A114
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007731325
http://id.ndl.go.jp/bib/000007731325
Bibliographic Record Category (NDL): 213