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Eighth international symposium on laser metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February 2005 : Merida, Yucatan, Mexico. : LM-2005 : Feb 2005, Merida, Mexico. (SPIE Proceedings ; 5776)

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Eighth international symposium on laser metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February 2005 : Merida, Yucatan, Mexico. : LM-2005 : Feb 2005, Merida, Mexico.

(SPIE Proceedings ; 5776)

Call No. (NDL)
M17-05-1389
Bibliographic ID of National Diet Library
000007770554
Material type
図書
Author
Centro de Investigaciones en Optica, AC.ほか
Publisher
SPIE
Publication date
c2005.
Material Format
Paper
Capacity, size, etc.
xx, 852 p. : ill. ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
0819457574
ISSN (series)
0277-786X
Title
Eighth international symposium on laser metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February 2005 : Merida, Yucatan, Mexico. : LM-2005 : Feb 2005, Merida, Mexico.
Series Title
SPIE Proceedings ; 5776
Author Heading
Centro de Investigaciones en Optica, AC.
International Measurement Confederation. TC 14 (Measurement of Geometrical Quantities)
Publication, Distribution, etc.
Bellingham : SPIE
Publication Date
c2005.
Publication Date (W3CDTF)
2005
Extent
xx, 852 p. : ill. ; 28 cm.