Jump to main content
図書

Beam injection assessment of defects in semiconductors : proceedings of the 5th international workshop on beam injection assessment of defects in semiconductors (BIADS 98), held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998. : Aug 1998, ------. (Diffusion and Defect Data, Solid State Data ; Diffusion and Defect Data Part B Solid State Phenomena ; 63-64)

Icons representing 図書

Beam injection assessment of defects in semiconductors : proceedings of the 5th international workshop on beam injection assessment of defects in semiconductors (BIADS 98), held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998. : Aug 1998, ------.

(Diffusion and Defect Data, Solid State Data ; Diffusion and Defect Data Part B Solid State Phenomena ; 63-64)

Call No. (NDL)
M17-05-1562
Bibliographic ID of National Diet Library
000007802090
Material type
図書
Author
Institut fur Halbleiterphysik Frankfurt an der Oder.ほか
Publisher
Scitec Publications
Publication date
c1998.
Material Format
Paper
Capacity, size, etc.
xiv, 537 p. : ill. ; 25 cm.
NDC
-
View All

Notes on use

Note (General):

Selected papers and discussions.Held in Parkhotel Schloss Wulkow near Berlin, Germany.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
390845039X
ISSN (series)
0377-6883.
Publication, Distribution, etc.
Publication Date
c1998.
Publication Date (W3CDTF)
1998
Extent
xiv, 537 p. : ill. ; 25 cm.