逐次2点法の平面誤差曲面測定への展開に関する研究

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Material Type: 博士論文
Title: 逐次2点法の平面誤差曲面測定への展開に関する研究
Title Transcription: チクジ 2テンホウノヘイメンゴサキョクメンソクテイエノテンカイニカンスルケンキュウ
Author/Editor: 何偉銘 [著]
Author Heading: 何, 偉銘カ, イメイ
Publication, Distribution, etc.: [何偉銘]
Publication Date: [2005]
Publication Date (W3CDTF): 2005
Extent: 1冊
Alternative Title: Application of sequential-two-points method to measurement of error surface profile
Degree grantor/type: 中央大学
Date Granted: 平成17年3月24日
Date Granted (W3CDTF): 2005
Dissertation Number: 甲第268号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: jpn
Alias of Author: He, WeiMing
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2005-K450
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007970129
http://id.ndl.go.jp/bib/000007970129
Bibliographic Record Category (NDL): 213