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Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices. : NATO advanced research workshop on defects in advanced high-k dielectric nano-electronic semiconductor devices : DeHik'2005 : Jul 2005, St. Petersburg, Russia. (NATO Science Series. Series II, Mathematics, Physics and Chemistry ; 220)

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Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices. : NATO advanced research workshop on defects in advanced high-k dielectric nano-electronic semiconductor devices : DeHik'2005 : Jul 2005, St. Petersburg, Russia.

(NATO Science Series. Series II, Mathematics, Physics and Chemistry ; 220)

Call No. (NDL)
M17-06-711
Bibliographic ID of National Diet Library
000008101223
Material type
図書
Author
-
Publisher
Springer
Publication date
c2006.
Material Format
Paper
Capacity, size, etc.
x, 492 p. : ill. ; 25 cm.
NDC
-
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Paper

Material Type
図書
ISBN
1402043651 (HB)
9781402043659 (ISBN-13 : HB)
1402043678 (e-book)
9781402043673 (ISBN-13 : e-book)
Title
Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices. : NATO advanced research workshop on defects in advanced high-k dielectric nano-electronic semiconductor devices : DeHik'2005 : Jul 2005, St. Petersburg, Russia.
Series Title
NATO Science Series. Series II, Mathematics, Physics and Chemistry ; 220
Publication, Distribution, etc.
Dordrecht : Springer
Publication Date
c2006.
Publication Date (W3CDTF)
2006
Extent
x, 492 p. : ill. ; 25 cm.
Place of Publication (Country Code)
NL
NDLC
M17