2005 IEEE VLSI-TSA international symposium on VLSI design, automation & test : (VLSI-TSA-DAT) : proceedings of technical papers : April 27-29, 2005 : Ambassador Hotel Hsinchu, Taiwan. : international symposium on VLSI technology, systems, and applications : VLSI-TSA-TECH : Apr 2005, Hsinchu, Taiwan.

2005 IEEE VLSI-TSA international symposium on VLSI design, automation & test : (VLSI-TSA-DAT) : proceedings of technical papers : April 27-29, 2005 : Ambassador Hotel Hsinchu, Taiwan. : international symposium on VLSI technology, systems, and applications : VLSI-TSA-TECH : Apr 2005, Hsinchu, Taiwan.

Call No. (NDL): M17-06-2456
Bibliographic ID of National Diet Library: 000008307581

Material type: 図書

Author: International Symposium on VLSI Design, Automation, and Test (2005 : Hsin-chu shih, Taiwan)

Publisher: ERSO/ITRI

Publication date: c2005.

Material Format: Paper

Capacity, size, etc.: 348, ii p. : ill. ; 30 cm.

NDC: -

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Note (General)：: Papers and abstracts."Starting 2005, the International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) will be divided into two con...

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Paper

Material Type: 図書
ISBN: 0780390601
Title: 2005 IEEE VLSI-TSA international symposium on VLSI design, automation & test : (VLSI-TSA-DAT) : proceedings of technical papers : April 27-29, 2005 : Ambassador Hotel Hsinchu, Taiwan. : international symposium on VLSI technology, systems, and applications : VLSI-TSA-TECH : Apr 2005, Hsinchu, Taiwan.
Author Heading: International Symposium on VLSI Design, Automation, and Test (2005 : Hsin-chu shih, Taiwan)
Publication, Distribution, etc.: Hsinchu : ERSO/ITRI
Piscataway : IEEE
Publication Date: c2005.
Publication Date (W3CDTF): 2005
Extent: 348, ii p. : ill. ; 30 cm.
Alternative Title: 2005 IEEE VLSI-TSA international symposium on VLSI design, automation and test : (VLSI-TSA-DAT) : proceedings of technical papers : April 27-29, 2005 : Ambassador Hotel Hsinchu, Taiwan
Place of Publication (Country Code): TW
Text Language Code: eng
Subject Heading: Integrated circuits -- Very large scale integration -- Congresses.
LCC: TK7874
DDC: 621.39/5
NDLC: M17
Note (General): Papers and abstracts.
"Starting 2005, the International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) will be divided into two conferences, (...) " -- foreword.
IEEE cat no 05TH8803.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-06-2456
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008307581
http://id.ndl.go.jp/bib/000008307581
LC Control Number: 2005922383
https://lccn.loc.gov/2005922383
RLIN No.: DCLC2005922383-B
Bibliographic Record Category (NDL): 215