Studies on power constrained test techniques for VLSI circuits

Studies on power constrained test techniques for VLSI circuits

Call No. (NDL): UT51-2006-L937
Bibliographic ID of National Diet Library: 000008335485

Material type: 博士論文

Author: Zhiqiang You [著]

Publisher: [Zhiqiang You]

Publication date: 2005

Material Format: Paper

Capacity, size, etc.: 1冊

Name of awarding university/degree: 奈良先端科学技術大学院大学,博士 (工学)

Notes on use

Note (General)：: 博士論文

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Paper

Material Type: 博士論文
Title: Studies on power constrained test techniques for VLSI circuits
Author/Editor: Zhiqiang You [著]
Author Heading: 尤, 志強ヨウ, ジチャン
Publication, Distribution, etc.: [Zhiqiang You]
Publication Date: 2005
Publication Date (W3CDTF): 2005
Extent: 1冊
Alternative Title: VLSI回路の省電力テストに関する研究 VLSI カイロノショウデンリョクテストニカンスルケンキュウ
Degree grantor/type: 奈良先端科学技術大学院大学
Date Granted: 平成18年3月24日
Date Granted (W3CDTF): 2006
Dissertation Number: 甲第567号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
Alias of Author: You, Zhiqiang
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2006-L937
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008335485
http://id.ndl.go.jp/bib/000008335485
Bibliographic Record Category (NDL): 213